🔴Product Name: Single side polished silicon wafer 🔴Growth Mode: Czochra Single Crystal (CZ) 🔴Flatness TIR:<3um, warping TTV:<10um, bending BOW<10um, roughness <0.5nm, granularity <10(for size >0.3um) 🔴Uses: For process and other synchronous radiation sample carrier, PVD/CVD coating substrate, magnetron sputtering growth sample XRD/SEM, atomic force, infrared spectrum, fluorescence spectrum analysis test base, molecular beam epitaxial growth base, X-ray analysis of crystal semiconductor. 🔴Scratch resistant blue film can be used directly. 🔴Package Include : 2PCS Uses: For process and other synchronous radiation sample carrier, PVD/CVD coating substrate, magnetron sputtering growth sample XRD/SEM, atomic force, infrared spectrum, fluorescence spectrum analysis test base, molecular beam epitaxial growth base, X-ray analysis of crystal semiconductor.
| Mpn | 5mmX5mm |
| Age_group | ADULT |
| Condition | NEW |
| Gender | UNISEX |
| Product_category | Gl_camera |
| Google_product_category | Cameras & Optics |
| Product_type | Industrial & Scientific > Science Education > Optics |